Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations - libro nuevo
ISBN: 9781441909312
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes.The reliable operation of integrated circuits (ICs) has become increasingly… Más…
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ISBN: 9781441909312
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Más…
Springer.com Nr. 978-1-4419-0931-2. Gastos de envío:Worldwide free shipping, , DE. (EUR 0.00) Details... |
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - libro nuevo
2009, ISBN: 9781441909312
Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Verkaufsrang: 3939836, Drafting & Presentation, Architectu… Más…
amazon.com |
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - libro nuevo
2009, ISBN: 9781441909312
Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Computer Aided Design, Graphics & Multimedia, Software & G… Más…
amazon.co.uk |
Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations - libro nuevo
ISBN: 9781441909312
VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, prese… Más…
hive.co.uk No. 9781441909312. Gastos de envío:Instock, Despatched same working day before 3pm, plus shipping costs., más gastos de envío Details... |
Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations - libro nuevo
ISBN: 9781441909312
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes.The reliable operation of integrated circuits (ICs) has become increasingly… Más…
ISBN: 9781441909312
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Más…
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - libro nuevo
2009
ISBN: 9781441909312
Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Verkaufsrang: 3939836, Drafting & Presentation, Architectu… Más…
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - libro nuevo
2009, ISBN: 9781441909312
Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Computer Aided Design, Graphics & Multimedia, Software & G… Más…
Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations - libro nuevo
ISBN: 9781441909312
VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, prese… Más…
Datos bibliográficos del mejor libro coincidente
Detalles del libro - Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
EAN (ISBN-13): 9781441909312
ISBN (ISBN-10): 1441909311
Año de publicación: 2009
Editorial: Springer
212 Páginas
Idioma: eng/Englisch
Libro en la base de datos desde 2010-09-08T14:13:02-05:00 (Mexico City)
Página de detalles modificada por última vez el 2023-09-12T11:47:23-06:00 (Mexico City)
ISBN/EAN: 1441909311
ISBN - escritura alterna:
1-4419-0931-1, 978-1-4419-0931-2
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: sunil, garg
Título del libro: vlsi, circuit analysis, analysis and design circuits
Datos del la editorial
Autor: Rajesh Garg
Título: Analysis and Design of Resilient VLSI Circuits - Mitigating Soft Errors and Process Variations
Editorial: Springer; Springer US
212 Páginas
Año de publicación: 2009-10-22
New York; NY; US
Idioma: Inglés
106,99 € (DE)
110,00 € (AT)
130,00 CHF (CH)
Available
XXII, 212 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Crosstalk; EDA; Power Supply Variation; Radiation Effects; Resilient VLSI Design; Soft Errors; VLSI; VLSI Design; algorithms; circuit design; design automation; electronic design automation; modeling; simulation; stability; B; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BB
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors.This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.Describes the state of the art in the areas of radiation tolerance circuit design and process variation tolerant circuit design Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers Includes supplementary material: sn.pub/extras
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