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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / Alberto Bosio (u. a.) / Buch / XV / Englisch / 2009 / Springer US / EAN 9781441909374 - Bosio, Alberto
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Bosio, Alberto:

Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / Alberto Bosio (u. a.) / Buch / XV / Englisch / 2009 / Springer US / EAN 9781441909374 - encuadernado, tapa blanda

2009, ISBN: 9781441909374

[ED: Gebunden], [PU: Springer US], Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to… Más…

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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Buch | XV | Englisch | 2009 | Springer US | EAN 9781441909374 - Bosio, Alberto
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Bosio, Alberto:

Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Buch | XV | Englisch | 2009 | Springer US | EAN 9781441909374 - encuadernado, tapa blanda

2009, ISBN: 9781441909374

[ED: Gebunden], [PU: Springer US], Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to… Más…

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3
Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel
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Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel:
Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Pasta blanda

2010

ISBN: 9781441909374

*Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies* - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies.… Más…

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud
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Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud:
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - encuadernado, tapa blanda

2009, ISBN: 9781441909374

Springer, Gebundene Ausgabe, Auflage: 2010, 186 Seiten, Publiziert: 2009-11-04T00:00:01Z, Produktgruppe: Buch, 2.16 kg, CAD & CAM, Grafik & Multimedia, Computer & Internet, Kategorien, Bü… Más…

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
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Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - encuadernado, tapa blanda

2009, ISBN: 1441909370

[EAN: 9781441909374], Neubuch, [PU: Springer], Clean and crisp and new!, Books

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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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ISBN:

1441909370


Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. TOC:Introduction.-Basics on SRAM Memory Testing.-Resistive-Open Defects in Core-Cells.-Open Defects in Pre-Charge Circuits.-Resistive-Open Defects in Address Decoders.-Resistive-Open Defects in Write Drivers.-Resistive-Open Defects in Sense Amplifiers.-Faults due to Process Variations in SRAMs.-Diagnosis of Dynamic Faults.-Conclusion.

Detalles del libro - Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies


EAN (ISBN-13): 9781441909374
ISBN (ISBN-10): 1441909370
Tapa dura
Tapa blanda
Año de publicación: 2009
Editorial: SPRINGER NATURE
171 Páginas
Peso: 0,431 kg
Idioma: eng/Englisch

Libro en la base de datos desde 2007-07-16T12:12:18-05:00 (Mexico City)
Página de detalles modificada por última vez el 2023-10-14T07:12:35-06:00 (Mexico City)
ISBN/EAN: 1441909370

ISBN - escritura alterna:
1-4419-0937-0, 978-1-4419-0937-4
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: bosio, luigi, serge, girard patrick, arnaud, generation
Título del libro: test, advanced method, sram

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