Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - encuadernado, tapa blanda
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Más…
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Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - encuadernado, tapa blanda
2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - encuadernado, tapa blanda
2012, ISBN: 3642273807
[EAN: 9783642273803], Neubuch, [PU: Springer], Clean and crisp and new!, Books
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - encuadernado, tapa blanda
2012, ISBN: 3642273807
[EAN: 9783642273803], Gebraucht, wie neu, [PU: Springer 2012-10-25], Item is in new condition., Books
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Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - encuadernado, tapa blanda
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
Biblio.co.uk |
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - encuadernado, tapa blanda
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Más…
Hofmann, Siegfried:
Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - encuadernado, tapa blanda2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - encuadernado, tapa blanda
2012
ISBN: 3642273807
[EAN: 9783642273803], Neubuch, [PU: Springer], Clean and crisp and new!, Books
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - encuadernado, tapa blanda
2012, ISBN: 3642273807
[EAN: 9783642273803], Gebraucht, wie neu, [PU: Springer 2012-10-25], Item is in new condition., Books
Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - encuadernado, tapa blanda
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Detalles del libro - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49)
EAN (ISBN-13): 9783642273803
ISBN (ISBN-10): 3642273807
Tapa dura
Año de publicación: 2012
Editorial: Springer
528 Páginas
Peso: 0,939 kg
Idioma: Englisch
Libro en la base de datos desde 2007-06-19T14:28:18-05:00 (Mexico City)
Página de detalles modificada por última vez el 2023-08-09T10:04:24-06:00 (Mexico City)
ISBN/EAN: 3642273807
ISBN - escritura alterna:
3-642-27380-7, 978-3-642-27380-3
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: hofman, siegfried hofmann, hofmann else, siegfried springer
Título del libro: before science, material sciences, materials sciences, surface science series, user guide, ray spectroscopy
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