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2012, ISBN: 9783642273810
A User-Oriented Guide, eBooks, eBook Download (PDF), Auflage, [PU: Springer-Verlag], [ED: 1], Springer-Verlag, 2012
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2012, ISBN: 9783642273810
A User-Oriented Guide, eBooks, eBook Download (PDF), 2013, [PU: Springer Berlin], Springer Berlin, 2012
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ISBN: 3642273815
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ab 170.99 € als pdf eBook: A User-Oriented Guide. Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Technik, Medien > Bücher… Más…
Andreas Luszczak:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science : A User-Oriented Guide - libro nuevoISBN: 9783642273810
This book presents the basics of Auger- and X-Ray Photoelectron Spectroscopy in Materials Science in logical order from sample preparation and instrument setup through data acquisition to… Más…
ISBN: 9783642273810
by Siegfried Hofmann, PRINT ISBN: 9783642273803 E-TEXT ISBN: 9783642273810 Additional ISBNs: 3642273807, 3642431739, 9783642273803, 9783642431739 Springer Nature eBook Other pricing struc… Más…
2012, ISBN: 9783642273810
A User-Oriented Guide, eBooks, eBook Download (PDF), Auflage, [PU: Springer-Verlag], [ED: 1], Springer-Verlag, 2012
2012, ISBN: 9783642273810
A User-Oriented Guide, eBooks, eBook Download (PDF), 2013, [PU: Springer Berlin], Springer Berlin, 2012
Datos bibliográficos del mejor libro coincidente
Detalles del libro - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
EAN (ISBN-13): 9783642273810
ISBN (ISBN-10): 3642273815
Año de publicación: 2012
Editorial: Springer-Verlag
528 Páginas
Idioma: eng/Englisch
Libro en la base de datos desde 2012-12-04T00:33:57-06:00 (Mexico City)
Página de detalles modificada por última vez el 2023-03-27T05:32:26-06:00 (Mexico City)
ISBN/EAN: 3642273815
ISBN - escritura alterna:
3-642-27381-5, 978-3-642-27381-0
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: hofman, siegfried hofmann, andreas luszczak, teubner andreas
Título del libro: auge auge, photo, material, ray spectroscopy
Datos del la editorial
Autor: Siegfried Hofmann
Título: Springer Series in Surface Sciences; Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide
Editorial: Springer; Springer Berlin
528 Páginas
Año de publicación: 2012-10-25
Berlin; Heidelberg; DE
Idioma: Inglés
309,23 € (DE)
317,90 € (AT)
354,00 CHF (CH)
Available
XX, 528 p.
EA; E107; eBook; Nonbooks, PBS / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Auger electron spectroscopy; interface analysis; scanning Auger microscopy; surface analysis; thin-film depth profiling; C; Condensed Matter Physics; Spectroscopy; Surfaces, Interfaces and Thin Film; Chemistry and Materials Science; Spektroskopie, Spektrochemie, Massenspektrometrie; Materialwissenschaft; BC
Outline of the Technique/Brief Description.- Theoretical Background.- Instrumentation.- Practical Surface Analysis with AES.- Data Evaluation/Quantification.- Problem Solving with AES (Examples).This is the most comprehensive book available on this widely used analytical technique Includes supplementary material: sn.pub/extras; This book deals with an important surface analytical technique. It gives a textbook-like introduction to the basics, information on instrumentals and an introduction to applications and problem-solving. It is a must for all researchers and advanced students in this field.
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