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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - Trent McConaghy & Kristopher Breen & Jeffrey Dyck & Amit Gupta
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Trent McConaghy & Kristopher Breen & Jeffrey Dyck & Amit Gupta:

Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - encuadernado, tapa blanda

ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Más…

Nr. A1019418990. Gastos de envío:Lieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Versandfertig innert 6 - 9 Werktagen, zzgl. Versandkosten. (EUR 17.51)
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - libro nuevo

ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Más…

Nr. 978-1-4614-2268-6. Gastos de envío:Worldwide free shipping, , DE. (EUR 0.00)
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - libro nuevo

ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Más…

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - McConaghy, Trent; Gupta, Amit; Dyck, Jeffrey; Breen, Kristopher
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McConaghy, Trent; Gupta, Amit; Dyck, Jeffrey; Breen, Kristopher:
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - encuadernado, tapa blanda

2012, ISBN: 146142268X

2013 Gebundene Ausgabe Elektronik, CustomIntegratedCircuits; IntegratedCircuits; ResilientVLSICircuits; Statisticalprocessvariations; Variation-AwareCAD; Variation-awareIntegratedCircui… Más…

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - Trent McConaghy
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Trent McConaghy:
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - encuadernado, tapa blanda

ISBN: 9781461422686

Hardback, [PU: Springer-Verlag New York Inc.], This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm an… Más…

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Detalles del libro
Variation-aware Design Of Custom Integrated Circuits: A Hands-on Field Guide
Autor:
Título:
ISBN:

9781461422686


This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.

Detalles del libro - Variation-aware Design Of Custom Integrated Circuits: A Hands-on Field Guide


EAN (ISBN-13): 9781461422686
ISBN (ISBN-10): 146142268X
Tapa dura
Año de publicación: 2013
Editorial: Springer-Verlag New York Inc.
204 Páginas
Peso: 0,473 kg
Idioma: Englisch

Libro en la base de datos desde 2008-11-30T21:10:29-06:00 (Mexico City)
Página de detalles modificada por última vez el 2024-03-02T05:30:12-06:00 (Mexico City)
ISBN/EAN: 9781461422686

ISBN - escritura alterna:
1-4614-2268-X, 978-1-4614-2268-6
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: dyck, kristopher, kristo, gupta, james hogan
Título del libro: field guide, hand, trent, few hands, variation, integrated circuits

Datos del la editorial

Autor: Trent McConaghy; Kristopher Breen; Jeffrey Dyck; Amit Gupta
Título: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
Editorial: Springer; Springer US
188 Páginas
Año de publicación: 2012-09-28
New York; NY; US
Impreso en
Peso: 4,321 kg
Idioma: Inglés
139,09 € (DE)
142,99 € (AT)
153,50 CHF (CH)
POD
XVI, 188 p.

BB; Circuits and Systems; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Custom Integrated Circuits; Integrated Circuits; Resilient VLSI Circuits; Statistical process variations; Variation-Aware CAD; Variation-Aware Integrated Circuit Design; Variation-Tolerant Integrated Circuit Design; Electronics and Microelectronics, Instrumentation; Nanotechnology and Microengineering; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Microsystems and MEMS; Elektronik; BC; EA

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.  Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows.Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable.Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation.Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification.Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications.Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3σ statistical and high-sigma statistical design.
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