2025, ISBN: 9789814273329
[ED: Buch], [PU: World Scientific Publishing Company], Neuware - Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circu… Más…
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ISBN: 9789814273329
Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on ele… Más…
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Electromigration In Ulsi Interconnections (International Series on Advances in Solid State Electronics and Technology, Band 0) - encuadernado, tapa blanda
2010, ISBN: 9789814273329
Wspc, Gebundene Ausgabe, Auflage: Illustrated, 312 Seiten, Publiziert: 2010-06-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: NUSTBK20171230-C0025961, 1.3 kg, Elektrotechnik, Ingenieu… Más…
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2010, ISBN: 9814273325
Gebundene Ausgabe TECHNOLOGY & ENGINEERING / Electronics / Semiconductors, mit Schutzumschlag 11, [PU:World Scientific Publishing Company]
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2025, ISBN: 9789814273329
[ED: Buch], [PU: World Scientific Publishing Company], Neuware - Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circu… Más…
ISBN: 9789814273329
Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on ele… Más…
Electromigration In Ulsi Interconnections (International Series on Advances in Solid State Electronics and Technology, Band 0) - encuadernado, tapa blanda
2010
ISBN: 9789814273329
Wspc, Gebundene Ausgabe, Auflage: Illustrated, 312 Seiten, Publiziert: 2010-06-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: NUSTBK20171230-C0025961, 1.3 kg, Elektrotechnik, Ingenieu… Más…
ISBN: 9789814273329
Fnac.com : Electromigration in Ulsi Interconnections, International Series on Advances in Solid State Electronics and Technology - Livre. Découvrez des nouveautés, des coups de cœur, des… Más…
2010, ISBN: 9814273325
Gebundene Ausgabe TECHNOLOGY & ENGINEERING / Electronics / Semiconductors, mit Schutzumschlag 11, [PU:World Scientific Publishing Company]
Datos bibliográficos del mejor libro coincidente
Detalles del libro - Electromigration in Ulsi Interconnections by Cher Ming Tan Hardcover | Indigo Chapters
EAN (ISBN-13): 9789814273329
ISBN (ISBN-10): 9814273325
Tapa dura
Año de publicación: 2010
Editorial: Cher Ming Tan
291 Páginas
Peso: 0,570 kg
Idioma: eng/Englisch
Libro en la base de datos desde 2012-01-13T11:40:48-06:00 (Mexico City)
Página de detalles modificada por última vez el 2023-12-07T18:30:13-06:00 (Mexico City)
ISBN/EAN: 9814273325
ISBN - escritura alterna:
981-4273-32-5, 978-981-4273-32-9
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: tan, ming, cher
Título del libro: international electronic, solid state, ulsi technology
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