Nyquist AD Converters, Sensor Interfaces, and Robustness : Advances in Analog Circuit Design, 2012 - libro nuevo

Libro en la base de datos desde 2012-03-16T20:30:01-06:00 (Mexico City)
Página de detalles modificada por última vez el 2022-06-01T13:27:13-05:00 (Mexico City)
ISBN/EAN: 1461445876

ISBN - escritura alterna:
1-4614-4587-6, 978-1-4614-4587-6
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: roer, basch
Título del libro: analog circuit design

Datos del la editorial

Autor: Arthur H.M. van Roermund; Andrea Baschirotto; Michiel Steyaert
Título: Nyquist AD Converters, Sensor Interfaces, and Robustness - Advances in Analog Circuit Design, 2012
Editorial: Springer; Springer US
294 Páginas
Año de publicación: 2012-11-26
New York; NY; US
Impreso en
Idioma: Inglés
149,79 € (DE)
154,00 € (AT)
177,00 CHF (CH)
Available
X, 294 p.

EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Analog Circuit Design; Analog to Digital Converters; CMOS ADCs; CMOS Connectivity; CMOS Reliability; CMOS Variability; Capacitive Sensor Interfaces; Nyquist A/D Converters; B; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Engineering; Elektronik; BB

Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.

This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. 

Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia

Presents material in a tutorial-based format

Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity