2010, ISBN: 3642098703
[EAN: 9783642098703], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], AFM; REM; UPS; CERAMICS; LIQUID; MICROSCOPY; POLYMER, Druck auf Anfrage Neuware -Crack initiation and growth ar… Más…
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ISBN: 9783642098703
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electron… Más…
Springer.com Nr. 978-3-642-09870-3. Gastos de envío:Worldwide free shipping, , DE. (EUR 0.00) Details... |
2010, ISBN: 9783642098703
Editor: Bhushan, Bharat, Editor: Fuchs, Harald, Springer, Paperback, Auflage: Softcover reprint of hardcover 1st ed. 2009, 279 Seiten, Publiziert: 2010-11-22T00:00:01Z, Produktgruppe: Boo… Más…
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2010, ISBN: 3642098703
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2010, ISBN: 9783642098703
Springer, 2010. Paperback. New. reprint edition. 280 pages. 9.00x6.00x0.66 inches., Springer, 2010, 6
Biblio.co.uk |
2010, ISBN: 3642098703
[EAN: 9783642098703], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], AFM; REM; UPS; CERAMICS; LIQUID; MICROSCOPY; POLYMER, Druck auf Anfrage Neuware -Crack initiation and growth ar… Más…
ISBN: 9783642098703
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electron… Más…
2010
ISBN: 9783642098703
Editor: Bhushan, Bharat, Editor: Fuchs, Harald, Springer, Paperback, Auflage: Softcover reprint of hardcover 1st ed. 2009, 279 Seiten, Publiziert: 2010-11-22T00:00:01Z, Produktgruppe: Boo… Más…
2010, ISBN: 3642098703
Pasta dura
Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Nanotechnologie, Materialwissenschaft, Technische Anwendung von Po… Más…
2010, ISBN: 9783642098703
Springer, 2010. Paperback. New. reprint edition. 280 pages. 9.00x6.00x0.66 inches., Springer, 2010, 6
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Detalles del libro - Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology)
EAN (ISBN-13): 9783642098703
ISBN (ISBN-10): 3642098703
Tapa dura
Tapa blanda
Año de publicación: 2010
Editorial: Springer
280 Páginas
Peso: 0,427 kg
Idioma: eng/Englisch
Libro en la base de datos desde 2011-04-27T09:47:34-05:00 (Mexico City)
Página de detalles modificada por última vez el 2023-11-25T06:39:25-06:00 (Mexico City)
ISBN/EAN: 3642098703
ISBN - escritura alterna:
3-642-09870-3, 978-3-642-09870-3
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: bhushan, harald fuchs
Título del libro: scanning probe, applied methods, xii, probe aufnahmen
Datos del la editorial
Autor: Bharat Bhushan
Título: NanoScience and Technology; Applied Scanning Probe Methods XII - Characterization
Editorial: Springer; Springer Berlin
224 Páginas
Año de publicación: 2010-11-22
Berlin; Heidelberg; DE
Impreso en
Idioma: Inglés
120,99 € (DE)
BC; Hardcover, Softcover / Technik/Allgemeines, Lexika; Elektronik; Verstehen; AFM; REM; UPS; ceramics; liquid; microscopy; polymer; Microsystems and MEMS; Spectroscopy; Surface and Interface and Thin Film; Nanotechnology; Surfaces, Interfaces and Thin Film; Polymers; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Nanotechnologie; Materialwissenschaft; Technische Anwendung von Polymeren und Verbundwerkstoffen; BB
Direct Force Measurements of Receptor–Ligand Interactions on Living Cells.- Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM.- Applications of Scanning Near-Field Optical Microscopy in Life Science.- Adhesion and Friction Properties of Polymers at Nanoscale: Investigation by AFM.- Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning.- Mechanical Properties of Metallic Nanocontacts.- Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids.- Microtensile Tests Using In Situ Atomic Force Microscopy.- Scanning Tunneling Microscopy of the Si(111)-7×7 Surface and Adsorbed Ge Nanostructures.Más, otros libros, que pueden ser muy parecidos a este:
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