Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - encuadernado, tapa blanda

EAN (ISBN-13): 9780387231167
ISBN (ISBN-10): 0387231161
Tapa dura
Tapa blanda
Año de publicación: 2005
Editorial: Springer-Verlag New York Inc.
358 Páginas
Peso: 0,744 kg
Idioma: eng/Englisch

Libro en la base de datos desde 2007-04-05T09:34:25-05:00 (Mexico City)
Página de detalles modificada por última vez el 2023-07-21T21:45:59-06:00 (Mexico City)
ISBN/EAN: 9780387231167

ISBN - escritura alterna:
0-387-23116-1, 978-0-387-23116-7
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: isaac asimov
Título del libro: instrumentation, introduction focused ion beams, focus 2008, theory beams, beam theory, focused seven

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Datos del la editorial

Autor: Lucille A. Giannuzzi
Título: Introduction to Focused Ion Beams - Instrumentation, Theory, Techniques and Practice
Editorial: Springer; Springer US
357 Páginas
Año de publicación: 2004-11-19
New York; NY; US
Idioma: Inglés
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
Available
XVII, 357 p. 34 illus., 28 illus. in color.

BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; SIMS; instruments; material; microscopy; spectroscopy; Condensed Matter Physics; Surfaces, Interfaces and Thin Film; Optical Materials; Spectroscopy; Materialwissenschaft; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; Spektroskopie, Spektrochemie, Massenspektrometrie; EA; BC

The focused ion beam (FIB) instrument has experienced an intensive period of maturation since its inception. Numerous new techniques and applications have been brought to fruition, and over the past few years, the FIB has gained acceptance as more than just an expensive sample preparation tool. It has taken its place among the suite of other instruments commonly available in analytical and forensic laboratories, universities, geological, medical and biological research institutions, and manufacturing plants. Although the utility of the FIB is not limited to the preparation of specimens for subsequent analysis by other analytical techniques, it has revolutionized the area of TEM specimen preparation. The FIB has also been used to prepare samples for numerous other analytical techniques, and offers a wide range of other capabilities. While the mainstream of FIB usage remains within the semiconductor industry, FIB usage has expanded to applications in metallurgy, ceramics, composites, polymers, geology, art, biology, pharmaceuticals, forensics, and other disciplines. Computer automated procedures have been configured for unattended use of FIB and dual platform instruments. New applications of FIB and dual platform instrumentation are constantly being developed for materials characterization and nanotechnology. The site specific nature of the FIB milling and deposition capabilities allows preparation and processing of materials in ways that are limited only by one's imagination. Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments.
Only text that discusses and presents the theory directly related to applications and the only one that disscusses the vast applications and techniques used in FIBs and dual platform instruments Includes supplementary material: sn.pub/extras