ISBN: 9780470511374
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrica… Más…
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ISBN: 9780470511374
ESD : Failure Mechanisms and Models, Hardcover by Voldman, Steven H., ISBN 0470511370, ISBN-13 9780470511374, Like New Used, Free shipping in the USElectrostatic discharge (ESD) failure m… Más…
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2009, ISBN: 0470511370
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ISBN: 9780470511374
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrica… Más…
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ISBN: 9780470511374
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrica… Más…
Voldman, Steven H.:
ESD : Failure Mechanisms and Models, Hardcover by Voldman, Steven H., Like Ne... - libro usadoISBN: 9780470511374
ESD : Failure Mechanisms and Models, Hardcover by Voldman, Steven H., ISBN 0470511370, ISBN-13 9780470511374, Like New Used, Free shipping in the USElectrostatic discharge (ESD) failure m… Más…
2009
ISBN: 0470511370
[EAN: 9780470511374], Nieuw boek, [SC: 1.14], [PU: John Wiley & Sons Inc, United States], Language: English. Brand new Book. Electrostatic discharge (ESD) failure mechanisms continue to i… Más…
ISBN: 9780470511374
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrica… Más…
2009, ISBN: 0470511370
[EAN: 9780470511374], Neubuch, [PU: John Wiley & Sons Inc, United States], Language: English. Brand new Book. Electrostatic discharge (ESD) failure mechanisms continue to impact semicondu… Más…
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Detalles del libro - ESD: Failure Mechanisms and Models Steven H. Voldman Author
EAN (ISBN-13): 9780470511374
ISBN (ISBN-10): 0470511370
Tapa dura
Año de publicación: 2009
Editorial: Wiley Core >2 >T
384 Páginas
Peso: 0,816 kg
Idioma: eng/Englisch
Libro en la base de datos desde 2008-03-18T03:54:46-06:00 (Mexico City)
Página de detalles modificada por última vez el 2024-03-31T00:59:42-06:00 (Mexico City)
ISBN/EAN: 9780470511374
ISBN - escritura alterna:
0-470-51137-0, 978-0-470-51137-4
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: voldman
Título del libro: esd, models failure
Datos del la editorial
Autor: Steven H. Voldman
Título: ESD - Failure Mechanisms and Models
Editorial: Wiley; John Wiley & Sons
408 Páginas
Año de publicación: 2009-07-17
Peso: 0,818 kg
Idioma: Inglés
129,00 € (DE)
Not available (reason unspecified)
168mm x 244mm x 27mm
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Circuit Theory & Design; Components & Devices; Electrical & Electronics Engineering; Elektrotechnik u. Elektronik; Halbleiter; Komponenten u. Bauelemente; Schaltkreise - Theorie u. Entwurf; Schaltkreistechnik; Semiconductors; Schaltkreise - Theorie u. Entwurf; Komponenten u. Bauelemente; Halbleiter
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology. Look inside for extensive coverage on: * failure analysis tools, EOS and ESD failure sources and failure models of semiconductor technology, and how to use failure analysis to design more robust semiconductor components and systems; * electro-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, gallium arsenide (GaAs), gallium nitride (GaN), magneto-resistive (MR) , giant magneto-resistors (GMR), tunneling magneto-resistor (TMR), devices; micro electro-mechanical (MEM) systems, and photo-masks and reticles; * practical methods to use failure analysis for the understanding of ESD circuit operation, temperature analysis, power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics, (connecting the theoretical to the practical analysis); * the failure of each key element of a technology from passives, active elements to the circuit, sub-system to package, illusterated with case studies of the elements, circuits and system-on-chip (SOC) in today's products. ESD: Failure Mechanisms and Models is a continuation of the author's series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.Más, otros libros, que pueden ser muy parecidos a este:
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