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2010, ISBN: 9781441909282
eBooks, eBook Download (PDF), 2010, Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate… Más…
ISBN: 9781441909282
*Power-Aware Testing and Test Strategies for Low Power Devices* / pdf eBook für 106.99 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Computer & Internet Medien > Bücher nein eBook a… Más…
ISBN: 9781441909282
; PDF; Scientific, Technical and Medical > Electronics & communications engineering > Electronics engineeri, Cambridge Scholars Publishing
2010, ISBN: 9781441909282
eBooks, eBook Download (PDF), 2010, [PU: Springer US], Springer US, 2010
2010, ISBN: 9781441909282
2010, eBook Download (PDF), eBooks, [PU: Springer US]
Datos bibliográficos del mejor libro coincidente
Detalles del libro - Power-Aware Testing and Test Strategies for Low Power Devices
EAN (ISBN-13): 9781441909282
ISBN (ISBN-10): 1441909281
Año de publicación: 2010
Editorial: Springer-Verlag GmbH
353 Páginas
Idioma: eng/Englisch
Libro en la base de datos desde 2011-10-05T13:05:02-05:00 (Mexico City)
Página de detalles modificada por última vez el 2023-06-15T01:53:26-06:00 (Mexico City)
ISBN/EAN: 9781441909282
ISBN - escritura alterna:
1-4419-0928-1, 978-1-4419-0928-2
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: girard patrick, xiaoqi
Título del libro: test
Datos del la editorial
Autor: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Título: Power-Aware Testing and Test Strategies for Low Power Devices
Editorial: Springer; Springer US
363 Páginas
Año de publicación: 2010-03-11
New York; NY; US
Idioma: Inglés
106,99 € (DE)
110,00 € (AT)
130,00 CHF (CH)
Available
XXI, 363 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; B; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BB
Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras
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