2009, ISBN: 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic re… Más…
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ISBN: 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic re… Más…
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2015, ISBN: 9783319155883
Volume 3, eBooks, eBook Download (PDF), 2015, [PU: Springer International Publishing], Seiten: 527, Springer International Publishing, 2015
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2015, ISBN: 9783319155883
Volume 3, eBooks, eBook Download (PDF), 2015, [PU: Springer International Publishing], Springer International Publishing, 2015
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2015, ISBN: 9783319155883
Volume 3, [ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]
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2009, ISBN: 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic re… Más…
Ernst Meyer, Franz J. Giessibl, Roland Wiesendanger, Seizo Morita:
Noncontact Atomic Force Microscopy - libro nuevoISBN: 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic re… Más…
2015
ISBN: 9783319155883
Volume 3, eBooks, eBook Download (PDF), 2015, [PU: Springer International Publishing], Seiten: 527, Springer International Publishing, 2015
2015, ISBN: 9783319155883
Volume 3, eBooks, eBook Download (PDF), 2015, [PU: Springer International Publishing], Springer International Publishing, 2015
2015, ISBN: 9783319155883
Volume 3, [ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]
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Detalles del libro - Noncontact Atomic Force Microscopy
EAN (ISBN-13): 9783319155883
ISBN (ISBN-10): 3319155881
Año de publicación: 2009
Editorial: Springer International Publishing
Libro en la base de datos desde 2015-08-07T07:52:55-05:00 (Mexico City)
Página de detalles modificada por última vez el 2022-11-25T10:47:30-06:00 (Mexico City)
ISBN/EAN: 9783319155883
ISBN - escritura alterna:
3-319-15588-1, 978-3-319-15588-3
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: ernst meyer, gies, ernst wies, wiese, roland wiesendanger, meyer franz
Datos del la editorial
Autor: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger
Título: NanoScience and Technology; Noncontact Atomic Force Microscopy - Volume 3
Editorial: Springer; Springer International Publishing
527 Páginas
Año de publicación: 2015-05-18
Cham; CH
Idioma: Inglés
213,99 € (DE)
220,00 € (AT)
236,00 CHF (CH)
Available
XXII, 527 p. 256 illus., 159 illus. in color.
EA; E107; eBook; Nonbooks, PBS / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Atom Manipulation; Atomic Force Microscopy; Atomic Resolution; Atomic/Molecular Manipulation; Chemical Structure; Force Mapping with Atomic Resolution; Liquid AFM; Magnetic Exchange Force Microscopy; Scanning Probe Techniques; Scanning Tunneling Microscopy; B; Nanophysics; Surfaces, Interfaces and Thin Film; Spectroscopy; Nanotechnology; Chemistry and Materials Science; Nanowissenschaften; Materialwissenschaft; Spektroskopie, Spektrochemie, Massenspektrometrie; Nanotechnologie; BB
From the Contents: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy Deals with the various classes of materials studied at the atomic scale A valuable reference for researchers as well as a text for graduate students Written by leading researchers in the field Includes supplementary material: sn.pub/extras
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