ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Más…
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2012, ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Más…
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ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Más…
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2013, ISBN: 9783642297618
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2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), 4th ed. 2013, [PU: Springer Berlin], Springer Berlin, 2013
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ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Más…
Brent Fultz#James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - libro nuevo2012, ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Más…
ISBN: 9783642297618
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Más…
2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), Auflage, [PU: Springer Lehrbuch], [ED: 4], Springer Lehrbuch, 2013
2013, ISBN: 9783642297618
eBooks, eBook Download (PDF), 4th ed. 2013, [PU: Springer Berlin], Springer Berlin, 2013
Datos bibliográficos del mejor libro coincidente
Detalles del libro - Transmission Electron Microscopy and Diffractometry of Materials
EAN (ISBN-13): 9783642297618
ISBN (ISBN-10): 3642297617
Año de publicación: 2012
Editorial: Springer Lehrbuch
761 Páginas
Idioma: eng/Englisch
Libro en la base de datos desde 2012-11-07T01:35:01-06:00 (Mexico City)
Página de detalles modificada por última vez el 2023-01-10T16:14:26-06:00 (Mexico City)
ISBN/EAN: 9783642297618
ISBN - escritura alterna:
3-642-29761-7, 978-3-642-29761-8
Mode alterno de escritura y términos de búsqueda relacionados:
Autor del libro: james, howe, jam, brent, fultz
Título del libro: electron microscopy materials, material, electro, transmission
Datos del la editorial
Autor: Brent Fultz; James Howe
Título: Graduate Texts in Physics; Transmission Electron Microscopy and Diffractometry of Materials
Editorial: Springer; Springer Berlin
764 Páginas
Año de publicación: 2012-10-13
Berlin; Heidelberg; DE
Idioma: Inglés
90,94 € (DE)
93,50 € (AT)
100,50 CHF (CH)
Available
XX, 764 p.
EA; E107; eBook; Nonbooks, PBS / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffraction from Crystals; Imaging Lens Systems; Neutron Scattering; Small-Angle Scattering; Theory of Electron Microscopy and X-Ray Diffraction; Transmission Electron Microscopy; X-Ray Diffractometry; B; Spectroscopy; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Surface and Interface and Thin Film; Physics and Astronomy; Werkstoffprüfung; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC
Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.
James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications Explains the mathematics needed consistently through the book Helps to extend knowledge by indicating further reading Explains concepts in detail, with no requirement for different reference materials Includes supplementary material: sn.pub/extras
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